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Session 52 - AXAF, X-ray, Gamma Ray Instruments.
Display session, Thursday, January 08
Exhibit Hall,

[52.08] Resolving Point Sources with the Next Generation High Energy Gamma-Ray Telescope

A. Chen (NASA/GSFC, NAS/NRC Research Associate), P. Kaaret (Columbia Univ.)

The next generation high energy (MeV-GeV) gamma-ray telescope will be sensitive enough to detect point sources at least an order of magnitude fainter than EGRET can detect. We used EGRET measurements of the extragalactic background and the high-latitude source counts to extrapolate the source counts to low fluxes, and found that as many as 50,000 sources with |b|>10\arcdeg may have fluxes above the threshold of the next generation telescope. In order to resolve these sources, the new instrument must have adequate angular resolution. We will demonstrate the relationship between instrument sensitivity and the resulting angular resolution requirements, and discuss ways of achieving those requirements.


The author(s) of this abstract have provided an email address for comments about the abstract: awc@egret.gsfc.nasa.gov

Program listing for Thursday