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C. Schwartz (Colby College), R. Bruni (SAO), K. Byun (Harvard U.), J. Everett (SAO), A. Ivan (SAO \& MIT), S. Romaine (SAO \& Bunting Institute, Radcliffe College)
We present results of a study in multilayer optics for the Hard X-ray component of the Constellation-X Mission, designed to observe X-ray sources at energies of 10 to ~80 keV. The Hard X-ray Telescope (HXT) will provide high spatial resolution (~1 arcmin) observations of many perplexing astronomical phenomena, including Active Galactic Nuclei, Supernova Remnants and other high energy objects. Tungsten-Silicon and Carbon-Tungsten multilayers were fabricated at the Smithsonian Astrophysical Observatory Multilayer Facility (MLF). Samples were characterized using Transmission Electron Microscopy, Atomic Force Microscopy and Grazing incidence X-ray Reflectometry. The data obtained were used to assess the quality of the samples.
The author(s) of this abstract have provided an email address for comments about the abstract: c_schwar@colby.edu