B. E. Unks, R. J. Bruni (Harvard-Smithsonian Center for Astrophysics), H. Eguchi (Brown University), P. Gorenstein, S.E. Romaine (Harvard-Smithsonian Center for Astrophysics)
The Constellation-X Hard X-ray Telescope (HXT) will utilize depth graded W/Si or Pt/C multilayer coatings in a grazing incidence configuration. This will achieve a large effective area at high energies (1500 cm2 at 40 keV). To date, multilayer coatings have been flown on satellites such as TRACE, which are lower energy, normal incidence applications. It is important to characterize the performance and stability of these new coatings before flight. Using the National Synchrotron Light Source (NSLS) at Brookhaven National Lab, we have obtained reflectivity measurements as a function of incidence angle and energy. We present the reflectance modeling for both Pt/C and W/Si multilayers in addition to three year historical stability data for W/Si coatings. We then discuss the implications of these results on the Constellation-X HXT as well as other future X-ray observatories. This work is supported in part by NASA Contract NAS8-03060.
Bulletin of the American Astronomical Society, 36 5
© 2004. The American Astronomical Society.