8th HEAD Meeting, 8-11 September, 2004
Session 25 X-ray Binaries and White Dwarfs
Poster, Friday, September 10, 2004, 9:00am-10:00pm

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[25.08] Quantile analysis on faint X-ray sources of ChaMPlane survey

J. Hong, J. Grindlay, E. Schlegel, S. Laycock, M. van den Berg, P. Zhao, X. Koenig (CfA), H. Cohn, P. Lugger, A. Rogel (IU)

Quantile analysis is a new spectral classification technique for X-ray sources with limited statistics and is superior to conventional approaches using X-ray colors and hardness ratio. We apply the quantile analysis technique to X-ray sources discovered by the Chandra Multiwavelength Plane (ChaMPlane) survey. This is a particularly efficient way to pick out source populations from their X-ray colors, including the hard sources expected for accretion-powered systems (see Grindlay et al). We investigate the X-ray spectral properties of X-ray sources in the Galactic plane, using the quantile color-color diagram (QCCD) based on median and quartile ratio. We use QCCDs to test various spectral models such as power-law, thermal Bremsstrahlung, black body emission on ChaMPlane fields to pick out hard sources (see Grindlay et al).

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The author(s) of this abstract have provided an email address for comments about the abstract: jaesub@head.cfa.harvard.edu

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© 2004. The American Astronomical Soceity.