[Previous] | [Session 8] | [Next]
J. D. Garnett (Raytheon Systems Co.), W. J. Forrest, J. L. Pipher, W. J. Glaccum (University of Rochester), C. R. McCreight, M. E. McKelvey, R. E. McMurray, Jr. (NASA Ames Research Center)
This poster will focus on sensor chip assemblies for the NGST mission. Recent InSb and Si:As performance results obtained from flight candidates for the SIRTF-IRAC instrument will be shown. The poster will also discuss progress on the ORIGINS program’s 1024x1024 cryo-cmos (Toperation < 20 K), low noise optimized, readout. Recent work on long integration time dark current measurements, noise vs. temperature, and visible performance of InSb will be discussed. Recent work on improved Si:As processing for reduced noise and dark current will also be discussed.
If the author provided an email address or URL for general inquiries, it is a
s follows: